Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data

ZHAO Jian-yin; LIU Fang; SUN Quan; ZHOU Jing-lun

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Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data

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- Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data
- Acta Electronica Sinica Vol. 33, Issue 2, Pages: 378-381(2005)
- 作者机构：
  
  国防科学技术大学人文与管理学院系统工程研究所,湖南,长沙,410073
- 作者简介：
- 基金信息：
- DOI：
  CLC： TB114.3
- Published：2005
- 稿件说明：
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ZHAO Jian-yin, LIU Fang, SUN Quan, et al. Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data[J]. Acta Electronica Sinica, 2005, 33(2): 378-381.
DOI：

ZHAO Jian-yin, LIU Fang, SUN Quan, et al. Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data[J]. Acta Electronica Sinica, 2005, 33(2): 378-381. DOI：

摘要

在对激光惯性约束聚变试验装置所用金属化膜脉冲电容器进行可靠性分析时

利用假设其寿命分布为Weibull分布的传统可靠性分析方法所得结果不能满足工程要求.作者通过分析电容的退化机理

给出了一个该型电容器的寿命分布模型

模型的求解是利用电容器的退化数据进行的

它具有比Weibull分布模型更为精确的特点

在工程实践中使用该模型对该型电容器进行可靠性分析可以大量的节约试验成本且结果精度更高.

Abstract

High energy density self-healing metallized-film pulse capacitor is the key component of inertial confinement laser fusion facility.Generally

the Weibull distribution model is adopted as lifetime distribution to analyze the capacitor reliability

but the results can not satisfy the demands and the cost of tests is very high.By analyzing degradation mechanism of metallized-film capacitor

this paper uses nonhomogeneous compound Poisson process to describe performance degradation process

and then presents a life distribution model of metallized-film pulse capacitor.Using this model

we can analyze the capacitor reliability through degradation data.This technique can not only assess and verify reliability level of the capacitors but also save tests cost.

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