A Test Set Compression Algorithm Based on Variable-Run-Length Code

PENG Xi-yuan; YU Yang

您当前的位置：

首页 >

文章列表页 >

A Test Set Compression Algorithm Based on Variable-Run-Length Code

更新时间：2025-07-16

- A Test Set Compression Algorithm Based on Variable-Run-Length Code
- Acta Electronica Sinica Vol. 35, Issue 2, Pages: 197-201(2007)
- 作者机构：
  
  哈尔滨工业大学自动化测试与控制系,黑龙江,哈尔滨,150001
- 作者简介：
- 基金信息：
- DOI：
  CLC： TP391.76
- Published：2007
- 稿件说明：
移动端阅览
PENG Xi-yuan, YU Yang. A Test Set Compression Algorithm Based on Variable-Run-Length Code[J]. Acta Electronica Sinica, 2007, 35(2): 197-201.
DOI：

PENG Xi-yuan, YU Yang. A Test Set Compression Algorithm Based on Variable-Run-Length Code[J]. Acta Electronica Sinica, 2007, 35(2): 197-201. DOI：

摘要

基于IP核的设计思想推动了SOC设计技术的发展

却使SOC的测试数据成几何级数增长.针对这一问题

本文提出了一种有效的测试数据压缩算法——变游程(Variable-Run-Length)编码算法来减少测试数据量、降低测试成本.该算法编码时同时考虑游程0和游程1两种游程

大大减小了测试数据中长度较短游程的数量

提高了编码效率.理论分析和实验数据表明

变游程编码能取得较同类编码算法更高的压缩效率

能够显著减少测试时间、降低测试功耗和测试成本.

Abstract

SOC technology has developed rapidly

which makes the test data of SOC increasing dramatically.This paper presents an effective test data compression algorithm

Variable-Run-Length code.Both runs of 0s and runs of 1s in test data stream are mapped to codeword so as to reduce the number of short runs and improve compression radio.Theoretical analysis and experimental results show that Variable-Run-Length code can provide a higher compression radio than other compression algorithms and it also leads to a significant saving in peak and average power due to a careful mapping of the don't-cares in precomputed test sets to 1’s and 0’s.

关键词

Keywords

references

Views

846

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Research on High-Efficiency Integrated Circuit DFT Technology Based on Machine Learning

Test Data Compression for Multiple Scan Chains with Dynamic Vector Adjustment

Related Author

CAI Zhi-kuang

ZHAO Ze-yu

YANG Han

WANG Zi-xuan

GUO Yu-feng

LIU Jie

LIANG Hua-guo

YI Mao-xiang

Related Institution

College of Integrated Circuit Science and Engineering， Nanjing University of Posts and Telecommunications

National and Local Joint Engineering Laboratory of RF Integration and Micro-Assembly Technology， Nanjing University of Posts and Telecommunications

School of Computer and Information, Hefei University of Technology

School of Physics and Electronic Science,Fuyang Normal College

School of Electronic Science and Applied Physics, Hefei University of Technology

⁰