Test Set Optimization Based on Genetic Reordering

QIAO Jia-qing; FU Ping; YIN Hong-tao

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Test Set Optimization Based on Genetic Reordering

更新时间：2025-07-16

- Test Set Optimization Based on Genetic Reordering
- Acta Electronica Sinica Vol. 35, Issue 12, Pages: 2335-2338(2007)
- 作者机构：
  
  哈尔滨工业大学自动化测试与控制研究所,哈工大科学园3033信箱,黑龙江,哈尔滨,150080
- 作者简介：
- 基金信息：
- DOI：
  CLC： TP18
- Published：2007
- 稿件说明：
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QIAO Jia-qing, FU Ping, YIN Hong-tao. Test Set Optimization Based on Genetic Reordering[J]. Acta Electronica Sinica, 2007, 35(12): 2335-2338.
DOI：

QIAO Jia-qing, FU Ping, YIN Hong-tao. Test Set Optimization Based on Genetic Reordering[J]. Acta Electronica Sinica, 2007, 35(12): 2335-2338. DOI：

摘要

测试集优化是数字电路测试的一个基本问题.本文提出了一种基于遗传排序的测试集优化方法

采用遗传算法对测试集的"矢量-故障"矩阵的行向量排列顺序进行优化

并采用行列消去法作为适应度评估方法.实验结果表明

基于遗传排序的测试集优化方法有效地减少了测试矢量的数目

而且保证了所得的测试集中不包含冗余测试矢量.

Abstract

In this paper

a test set optimization method based on the genetic reordering is presented

which optimizes the row vectors’ order of the test set’s vector-fault matrix by genetic algorithm and adopts the row-column elimination as the evaluation method in the genetic process.Experiment results show that the method effectively reduces the number of the test vectors and ensures that no redundant test vector left in the optimal test set obtained.

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