1/ f Noise Denoting for Radiation Tatal Dose of Optocoupler

LI Ying-hui; CHEN Chun-xia; JIANG Cheng; LIU Yong-zhi

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1/ f Noise Denoting for Radiation Tatal Dose of Optocoupler

更新时间：2025-07-16

- 1/ f Noise Denoting for Radiation Tatal Dose of Optocoupler
- Acta Electronica Sinica Vol. 37, Issue 8, Pages: 1707-1711(2009)
- 作者机构：
  
  1. 电子科技大学光电信息学院,四川,成都,610054
  2. 重庆光电技术研究所,重庆,400060
  3. 电子科技大学光电信息学院四川成都,610054
  4. 重庆光电技术研究所重庆,400060
- 作者简介：
- 基金信息：
- DOI：
  CLC： O47TN2
- Published：2009
- 稿件说明：
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LI Ying-hui, CHEN Chun-xia, JIANG Cheng, et al. 1/ f Noise Denoting for Radiation Tatal Dose of Optocoupler[J]. Acta Electronica Sinica, 2009, 37(8): 1707-1711.
DOI：

LI Ying-hui, CHEN Chun-xia, JIANG Cheng, et al. 1/ f Noise Denoting for Radiation Tatal Dose of Optocoupler[J]. Acta Electronica Sinica, 2009, 37(8): 1707-1711. DOI：

摘要

本文在研究光电耦合器工作原理、辐照理论及1/f噪声理论的基础上

分析了光电耦合器辐照噪声产生机理及特性

建立了光电耦合器总剂量辐照损伤噪声模型.研究结果表明

随着辐照总剂量增强

LED及光敏管氧化层中引入的氧化层陷阱密度增多

载流子数涨落增强

从而使电压噪声功率谱密度增加.实验结果验证理论分析的正确性

电压噪声功率谱密度可作为光电耦合器辐照损伤表征参量.

Abstract

Base on working principium of optocoupler

and the theory of radiation and 1/f noise

The mechanism and the charactory of radiation optocoupler are analysed

1/f noise radiation model are established.flowing tatal dose

Flowing the radiation dose increasing

traps of LED and phototransistor increasing

fluctuate of carries growing

the power spectrum of voltage noise largening

the power spectrum of voltage noise may be a new denotable parameter for optocoupler reliability.

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