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Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values
更新时间:2025-07-16
    • Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values

    • Acta Electronica Sinica   Vol. 39, Issue 6, Pages: 1253-1256(2011)
    • CLC: TP114
    • Published:2011

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  • FENG Jing. Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values[J]. Acta Electronica Sinica, 2011, 39(6): 1253-1256. DOI:

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