In lateral aberrations of an imaging electron optical system

the paraxial lateral aberrations exit widespread in the whole image plane and that is also the main aberrations which effect image quality of central image and determine limiting image resolution of system.In the present paper

the paraxial lateral aberrations expressed in general form have been derived emphatically by using asymptotic solutions of paraxial equation for imaging electron optics.By using a bi-electrode electrostatic concentric spherical system model

the analytical forms of two special solutions of paraxial rays expressed by asymptotic and accurate solutions have been deduced and tested.The paraxial sphero-chromatic aberrations of second and third order

as well as the paraxial chromatic aberration of magnification of third order

have been deduced.Result completely proves that the approach based on asymptotic solutions to solve the paraxial lateral aberrations is accurate enough and practicable.A simple and clear form for expressing paraxial lateral aberrations of imaging electron optical systems is suggested for practical use

which will have practical significance for study of aberrations of imaging electron optics and for design of image tubes.