Test Stimulus Optimization Design of Analog Circuit Based on Random Periodic Stimulus Function

LUO Hui; WANG You-ren; LIN Hua; JIANG Yuan-yuan

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Test Stimulus Optimization Design of Analog Circuit Based on Random Periodic Stimulus Function

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- Test Stimulus Optimization Design of Analog Circuit Based on Random Periodic Stimulus Function
- Acta Electronica Sinica Vol. 39, Issue 8, Pages: 1950-1954(2011)
- 作者机构：
  
  南京航空航天大学自动化学院,江苏,南京,210016
- 作者简介：
- 基金信息：
- DOI：
  CLC： TP206+.3
- Published：2011
- 稿件说明：
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LUO Hui, WANG You-ren, LIN Hua, et al. Test Stimulus Optimization Design of Analog Circuit Based on Random Periodic Stimulus Function[J]. Acta Electronica Sinica, 2011, 39(8): 1950-1954.
DOI：

LUO Hui, WANG You-ren, LIN Hua, et al. Test Stimulus Optimization Design of Analog Circuit Based on Random Periodic Stimulus Function[J]. Acta Electronica Sinica, 2011, 39(8): 1950-1954. DOI：

摘要

模拟电路测试中不同的激励源会影响电路的可测性

本文根据任意周期函数可由傅立叶级数展开成一个直流分量和一系列正弦函数叠加的原理

设计一种新的基于任意周期激励函数的模拟电路测试激励优化方法.该方法以任意周期激励函数作为优化对象

以最大特征样本的核类间距离作为优化目标

分析待测电路输入输出信号的幅值、频率和相位关系作为约束条件

设计构建一个单目标多约束的线性数学优化模型.该方法具有普适性能

优化得到的测试激励信号提高了模拟电路故障诊断性能.

Abstract

Using different test stimuli have an affect on the testability of the circuit under test (CUT).According to the Fourier series expression theory

which is described as the periodic function can be decomposed into a direct current component and a series of sine functions

a new optimization method for test stimulus generation of analog circuit is proposed.In this method

the random stimulus function is used as the optimal object

the optimal target is to obtain the maximal distance of different classes of faulty samples in the kernel space

and the constraint conditions are designed on the base of the relationship of amplitude

frequency and phase between the input and the output of the CUT

so a linear optimal model is constructed with one target and multiple constraints.This method has general adaptability.The optimal test stimuli succeed in improving the diagnosis results.

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