A Calibration Procedure for Two-Port Vector Network Analyzer Based on 10-Term Error Model

ZHAO Wei; ZHAO Yong-jiu; YUAN Chun-hua; QIN Hong-bo; QIANG Li

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A Calibration Procedure for Two-Port Vector Network Analyzer Based on 10-Term Error Model

更新时间：2025-07-16

- A Calibration Procedure for Two-Port Vector Network Analyzer Based on 10-Term Error Model
- Acta Electronica Sinica Vol. 39, Issue 10, Pages: 2469-2472(2011)
- 作者机构：
  
  1. 南京航空航天大学电子信息工程学院,江苏,南京,210016
  2. 西安电子科技大学机电工程学院,陕西,西安,710071
  3. 南京航空航天大学电子信息工程学院江苏南京,210016
  4. 西安电子科技大学机电工程学院陕西西安,710071
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM931
- Published：2011
- 稿件说明：
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ZHAO Wei, ZHAO Yong-jiu, YUAN Chun-hua, et al. A Calibration Procedure for Two-Port Vector Network Analyzer Based on 10-Term Error Model[J]. Acta Electronica Sinica, 2011, 39(10): 2469-2472.
DOI：

ZHAO Wei, ZHAO Yong-jiu, YUAN Chun-hua, et al. A Calibration Procedure for Two-Port Vector Network Analyzer Based on 10-Term Error Model[J]. Acta Electronica Sinica, 2011, 39(10): 2469-2472. DOI：

摘要

在三通道二端口矢量网络分析仪(Vector Network Analyzer

VNA)的校准过程中

引入长度未知的50欧姆传输线段作为校准件代替常见的短路-开路-匹配-直通(Short-Open-Load-Thru

SOLT)校准算法中的匹配校准件

减少了校准件数量且不需要已知校准件的全部特性

不仅降低了测试成本

同时简化了测试步骤.通过这种校准算法不必计算各个系统误差项的大小

待测件(Device Under Test

DUT)的散射矩阵直接由校准和测试过程中的散射参数测量值表示得到.最后

利用此方法计算二端口待测件的真实散射参数

并与SOLT算法进行对比

其结果吻合良好.

Abstract

In the calibration procedure for two-port vector network analyzer (VNA) with three measurement channels

the length-unknown 50 ohm line is used in short-open-load-thru (SOLT) calibration algorithm instead of Load standard.It is aimed to decrease the measurement cost and simplify the measurement process.Via this calibration procedure

the systematic error terms are not required and the accurate scattering parameters of a two-port device under test (DUT) can be obtained by the measured scattering parameters during the calibration and measurement procedure.Experimental verification was carried out through SOLT method

and excellent agreement is observed.

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Related Institution

The Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics

The 54th Research Institute of CETC

College of Electronic Information and Control Engineering, Beijing University of Technology

北京工业大学电子信息与控制工程学院

State Key Laboratory on Integrated Optoelectronics,Institute of Semiconductors,Chinese Academy of Sciences,P.O.Box 912

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