Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters ( 1.University of Electronics Science ＆ Technology,Chengdu,Sichuan 610054,China;

LI Xun-bo; CHEN Guang-ju; YAN Shun-bing

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Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters ( 1.University of Electronics Science ＆ Technology,Chengdu,Sichuan 610054,China;

更新时间：2025-07-16

- Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters ( 1.University of Electronics Science ＆ Technology,Chengdu,Sichuan 610054,China;
- Acta Electronica Sinica Vol. 31, Issue 12, Pages: 1897-1899(2003)
- 作者机构：
  
  1. 电子科技大学,四川,成都,610054
  2. 四川固体物理研究所,重庆,40060
  3. 电子科技大学四川成都,610054
  4. 四川固体物理研究所重庆,40060
- 作者简介：
- 基金信息：
- DOI：
  CLC： TP274
- Published：2003
- 稿件说明：
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LI Xun-bo, CHEN Guang-ju, YAN Shun-bing. Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters ( 1.University of Electronics Science ＆ Technology,Chengdu,Sichuan 610054,China;[J]. Acta Electronica Sinica, 2003, 31(12): 1897-1899.
DOI：

LI Xun-bo, CHEN Guang-ju, YAN Shun-bing. Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters ( 1.University of Electronics Science ＆ Technology,Chengdu,Sichuan 610054,China;[J]. Acta Electronica Sinica, 2003, 31(12): 1897-1899. DOI：

摘要

本文采用数字处理技术对高速ADC的微分相位、微分增益的测试方法进行研究

给出了方程式

构建了数字测试系统

完成了高速ADC微分相位及微分增益的测试

该方法适用于大批量的ADC动态参数的测试.

Abstract

Test methods based on DSP for Differential Phase(DP) and Differential Gain(DG) of high speed and log-to-digital converter (ADC) are studied.And the equations are proposed.The ADC dgnamic test circuit has been built.The high speed ADC converter has been tested using the method;Examples of test results are shown that the method is suitable for measuring DP or DG of an ADC system.

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