Analysis of Disturbed Pattern through NURBS-UTD method

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Analysis of Disturbed Pattern through NURBS-UTD method

更新时间：2025-07-16

- Analysis of Disturbed Pattern through NURBS-UTD method
- Acta Electronica Sinica Vol. 38, Issue 6, Pages: 1323-1327(2010)
- 作者机构：
  
  （西安电子科技大学天线与微波技术国家重点实验室，，）,陕西,西安,710071
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN011TN821
- Published：2010
- 稿件说明：
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FONT face, Verdana, WANG Nan, et al. Analysis of Disturbed Pattern through NURBS-UTD method[J]. Acta Electronica Sinica, 2010, 38(6): 1323-1327.
DOI：

FONT face, Verdana, WANG Nan, et al. Analysis of Disturbed Pattern through NURBS-UTD method[J]. Acta Electronica Sinica, 2010, 38(6): 1323-1327. DOI：

摘要

<FONT face=Verdana>本文研究基于任意曲面建模的UTD方法，引入NURBS曲面建模技术对电大尺寸目标建模，给出了NURBS-UTD方法中反射射线场以及表面绕射射线场的数值求解方法。与曲面有关的具体参数，根据微分几何的基本原理结合参数曲面定义使用各种数值方法进行处理，对线积分使用定义展开。针对实际当中任意几何造型的电大尺寸平台的电磁特性分析，本文方法不仅能够处理初等解析曲面，也能够处理任意弯曲的曲面模型，并且不需要消耗大量计算资源又提高了建模精度，文中给出实例进行说明。

Abstract

<FONT face=Verdana>The UTD method applied to arbitrary surfaces is studied in this paper where the NURBS technique is introduced to construct electrically large targets and on the basis of the ray-tracing work done before

the calculation of ray fields including reflected ray field and creeping ray field are given. Combining the definition of NURBS with basic principles of differential geometry

parameters used in formulas are solved by numerical means while the line integral is expended by definition. Aiming at analyzing electrically large targets with arbitrary shapes

method presented

which doesn’t need much calculation resources and possesses higher precision

can be applied not only to typical analytical objects but also to arbitrary surfaces and examples of application are given.

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