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Effect of Helical Slow-Wave Structure Parameter Variations on TWT Cold-Test Characteristics
更新时间:2025-07-16
    • Effect of Helical Slow-Wave Structure Parameter Variations on TWT Cold-Test Characteristics

    • Acta Electronica Sinica   Vol. 32, Issue 9, Pages: 1511-1514(2004)
    • CLC: TN124
    • Published Online:25 September 2004

      Published:2004

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  • LI Shi, LIU Wei, SU Xiao-bao, et al. Effect of Helical Slow-Wave Structure Parameter Variations on TWT Cold-Test Characteristics[J]. Acta Electronica Sinica, 2004, 32(9): 1511-1514. DOI:

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