HE Jin, ZHANG Xing, HUANG Ru, et al. Calculation of Punch-Through Limited Breakdown Voltage of Parallel-Plane Junction and Comparisons[J]. Acta Electronica Sinica, 2001, 29(5): 689-691.
DOI:
HE Jin, ZHANG Xing, HUANG Ru, et al. Calculation of Punch-Through Limited Breakdown Voltage of Parallel-Plane Junction and Comparisons[J]. Acta Electronica Sinica, 2001, 29(5): 689-691.DOI:
Calculation of Punch-Through Limited Breakdown Voltage of Parallel-Plane Junction and Comparisons
Calculation of punch-through limited breakdown voltage for parallel-plane junction has been examined in this paper.The solution of impact ionization integral for the punch-through limited breakdown voltage has been proposed in the polynomial fit function for the first time.The results of three different models have been compared.It has been shown that the revised critical electrical field model solution coincides with the numerical solution of impact ionization integral
and the classic critical electrical field model introduces significant inaccuracies.