WU Jie 1, XIA Guan qun 1, SHU Wei ming 1, et al. Study on High Temperature Characteristics of Al0.3Ga0.22In0.48P/GaAsHBTerojunction Bipolar Transistors[J]. Acta Electronica Sinica, 1999, (11).
WU Jie 1, XIA Guan qun 1, SHU Wei ming 1, et al. Study on High Temperature Characteristics of Al0.3Ga0.22In0.48P/GaAsHBTerojunction Bipolar Transistors[J]. Acta Electronica Sinica, 1999, (11).DOI:
Study on High Temperature Characteristics of Al0.3Ga0.22In0.48P/GaAsHBTerojunction Bipolar Transistors
High temperature Al 0 3 Ga 0 22 In 0 48 P/GaAs heterojunction bipolar transistors (HBTs) were fabricated
and their DC electric characteristics were studied in detail from 300K up to 623K.Experimental results show that Al 0 3 Ga 0 22 In 0 48 P/GaAs HBT possess excellent high temperature properties.Over the temperature range from 300K to 623K
current gain changes less than 10% from its average value.At ambient temperature higher than 623K
HBT failed.Analysis has shown that the short circuited BC junction is the direct cause of HTB’s failure.Further research works need to be done in order to fully understand BC junction’s failure mechanism.