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1. 辽宁大学电子科学与工程系
2. 成都星光电工厂
3. 辽宁大学电子科学与工程系成都星光电工厂
Published:1999
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[1]丛众,吴春瑜,王荣,石广元,闫东梅,张雯,朱肖林,汪永生.宽温高频高反压沟道基区晶体管研制[J].电子学报,1999(05):54-56.
Cong Zhong, Wu Chunyu, Wang Rong, et al. Study and Fabrication of Channel Base Transistor with Wider Temperature Range,High Frequency and High Breakdown Voltage[J]. Acta Electronica Sinica, 1999, (5).
耗尽基区双极晶体管也称为双极静电感应晶体管(BSIT),其电流放大系数(hFE)具有负的温度系数.双极结型晶体管(BJT)的hFE具有正的温度系数.将BSIT与BJT并联,采用BJT常规平面工艺制造了宽温高频高反压沟道基区双极PNP晶体管.本文描述了这种新器件结构、工作原理、设计与制造.新器件突出特点是:当温度变化较大时,hFE漂移较小.测试结果表明:环境温度从25℃升到180℃时,器件的hFE随温度T的变化率小于35%.优于同类型的常规双极结型晶体管,平均改善20%.当温度从25℃降到-55℃,器件的hFE变化率小于或等于30%.
Using the normal planar technology of bipolar junction transistor
we have fabricated the p n p high frequency
high breakdown voltage transistors which can operate in the wider temperature range from -55℃ to 180℃.In this paper we also describe the design
structure and fabrication of the new device with a smaller drift of h FE when temperature is changed.The tested results show that the changing rate of h FE of the new device is less than or equal to 35% when temperature is raised from 25℃ up to 180℃
which is 20% better than that of the normal bipolar transistor;whereas the changing rate of h FE is less than or equal to 30% when temperature is fallen from 25℃ down to -55℃.
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