The Study of the Method about Detection on Burst  Noise in Transistor Using the Integrated Bispectrum

Cong Yuliang; Wang Shuxun; Zhao Jiyin; Dai Yisong

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The Study of the Method about Detection on Burst Noise in Transistor Using the Integrated Bispectrum

更新时间：2025-12-08

- The Study of the Method about Detection on Burst Noise in Transistor Using the Integrated Bispectrum
- Acta Electronica Sinica Issue 5, (1999)
- 作者机构：
  
  吉林工业大学电子工程系
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN320.6
- Published：1999
- 稿件说明：
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[1]丛玉良,王树勋,赵继印,戴逸松.晶体管爆裂噪声的积分双谱检测方法研究[J].电子学报,1999(05):100-101.

Cong Yuliang, Wang Shuxun, Zhao Jiyin, et al. The Study of the Method about Detection on Burst Noise in Transistor Using the Integrated Bispectrum[J]. Acta Electronica Sinica, 1999, (5).
[1]丛玉良,王树勋,赵继印,戴逸松.晶体管爆裂噪声的积分双谱检测方法研究[J].电子学报,1999(05):100-101. DOI：

Cong Yuliang, Wang Shuxun, Zhao Jiyin, et al. The Study of the Method about Detection on Burst Noise in Transistor Using the Integrated Bispectrum[J]. Acta Electronica Sinica, 1999, (5). DOI：

摘要

本文根据对积分双谱分布特性分析，论证了晶体管爆裂噪声是服从非高斯且非对称分布的，并提出可利用积分双谱方法来检测晶体管爆裂噪声．

Abstract

Based on the characteristic of the integrated bispectrum

it can be proved that the probability density function of burst noise is non Gaussian and asymmetric.The method of detection on burst noise in transistor using the integrated bispectrum is given in this paper.

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