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Parallel Testing Based on Test Subsession Partitioning
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    • Parallel Testing Based on Test Subsession Partitioning

    • Acta Electronica Sinica   Issue 2, (1999)
    • CLC: TN470.7
    • Published:1999

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  • Xiang Dong. Parallel Testing Based on Test Subsession Partitioning[J]. Acta Electronica Sinica, 1999, (2). DOI:

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