The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT

聂世琦; 林书铨; 黄保麟

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The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT

更新时间：2025-12-08

- The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT
- Acta Electronica Sinica Issue 9, Pages: 67-70(1998)
- 作者机构：
  
  1. 上海交通大学HDTV研究所!上海
  2. 200030
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN141.3
- Published：1998
- 稿件说明：
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[1]聂世琦,林书铨,黄保麟.电子束扫描式扁平显像管偏转系统的电子光学分析[J].电子学报,1998(09):67-70.

聂世琦, 林书铨, 黄保麟. The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT[J]. Acta Electronica Sinica, 1998, (9): 67-70.
[1]聂世琦,林书铨,黄保麟.电子束扫描式扁平显像管偏转系统的电子光学分析[J].电子学报,1998(09):67-70. DOI：

聂世琦, 林书铨, 黄保麟. The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT[J]. Acta Electronica Sinica, 1998, (9): 67-70. DOI：

摘要

电子束扫描式扁平显像管中，电子束基本要偏转数次后上屏．本文用曲光轴聚焦理论分析了扁平显像管的偏转系统，包括正交场偏转扫描和电极推动扫描方式．文中给出了电子运动所在的电场分布的级数表达式．由变分方程出发，给出了偏转时曲光轴坐标中的高斯轨迹方程，并对方案进行了计算机模拟，分析了各种因素对于偏转电子束的影响．

Abstract

In the electron beam scanning flat CRT

the electron beam usully is deflected several times. This paper analyses the deflection structure of FCRT. The electric field expression of the structure is given. From the variation equation

the Gauss trajection equation in the deflected optical axis coordinate is given. By comuter calculation

the factors affecting electron beam deflection is analysed.

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