洪伟, 朱震海. A Fast Algorithm for the Parameter Extraction of Multilayered Multiconductor lnterconnections:Finite Difference-Measured Equation of lnvariance Method[J]. Acta Electronica Sinica, 1997, (9).
洪伟, 朱震海. A Fast Algorithm for the Parameter Extraction of Multilayered Multiconductor lnterconnections:Finite Difference-Measured Equation of lnvariance Method[J]. Acta Electronica Sinica, 1997, (9).DOI:
A Fast Algorithm for the Parameter Extraction of Multilayered Multiconductor lnterconnections:Finite Difference-Measured Equation of lnvariance Method
the Measured Equation of Invariance (MEI) method is used to calculate the capacitance and inductance matrices of the multilayered multiconductor interconnectionsfor the first time. Because of the introduction of the measuring loop
the deduction of Green’s function in multilayered multicopductor structure and the calculation of Sommerfeld type integrals areavoided. At the same time
the postulate of geometry specific in the conventional MEI method iscanceled. Numerical results show that the new algorithm in this paper is correct and faster than thecommon methods such as MoM
BEM
FEM
etc. It is also a very nexible method and can be usedto analyze the interconnections with arbitrary shape and lossy conductors. Therefore it is an idealmethod for the parameter extraction. Based upon the capacitance and inductance matrices
we havealso calculated the transient response of an interconnection terminated in nonlinear loads.