宋犇, 洪伟. Capacitance Extraction of the Via Hole Structure Embedded in Multilayered Dielectric Media with Perforated Reference Plane[J]. Acta Electronica Sinica, 1998, (3): 103-105.
宋犇, 洪伟. Capacitance Extraction of the Via Hole Structure Embedded in Multilayered Dielectric Media with Perforated Reference Plane[J]. Acta Electronica Sinica, 1998, (3): 103-105.DOI:
Capacitance Extraction of the Via Hole Structure Embedded in Multilayered Dielectric Media with Perforated Reference Plane
Dimension Reduction Technique(DRT)combined with the Method of Lines(MoL)has been used to extract the capacitance of the via hole structure embedded in multilayered dielectric media with perforat ed reference planes.The numerical result given in this paper is in good agreement with that of Ansoft’software
but the CPU time is only a quarter of that of Ansoft’s and memory only one twentieth to one thirtieth of Ansoft’s.