The Application of Mathematic-Statistical Method in IC Mass Production──On the Relationship Between Processing Capability Index and Yield

Shi Linchu

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The Application of Mathematic-Statistical Method in IC Mass Production──On the Relationship Between Processing Capability Index and Yield

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- The Application of Mathematic-Statistical Method in IC Mass Production──On the Relationship Between Processing Capability Index and Yield
- Acta Electronica Sinica Issue 5, Pages: 125-128(1998)
- 作者机构：
  
  1. 中国华晶电子集团公司!无锡
  2. 214061
- 作者简介：
- 基金信息：
- DOI：
  CLC： TB114.2
- Published：1998
- 稿件说明：
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[1]石林初.数理统计方法在IC大生产中的应用──试论工序能力指数与成品率的关系[J].电子学报,1998(05):125-128.

Shi Linchu. The Application of Mathematic-Statistical Method in IC Mass Production──On the Relationship Between Processing Capability Index and Yield[J]. Acta Electronica Sinica, 1998, (5): 125-128.
[1]石林初.数理统计方法在IC大生产中的应用──试论工序能力指数与成品率的关系[J].电子学报,1998(05):125-128. DOI：

Shi Linchu. The Application of Mathematic-Statistical Method in IC Mass Production──On the Relationship Between Processing Capability Index and Yield[J]. Acta Electronica Sinica, 1998, (5): 125-128. DOI：

摘要

单道工序能力指数Cp和单道工序的成品率y是全面质量管理TQC（TotalQualityControl）的两个关键参数．本文利用余误差函数表和线性插值修正法计算了不同Cp的y值，并给出了对应表格，从而大大方便了数理统计方法在工业化大生产中的实际应用．

Abstract

Both processing capability index Cp and yield y in one step are key parameters in Total Quality Control（TQC）. The function y of Cp is calculated by means of Co-error function table and linear interpolating correction in this paper

and a table of y-Cp is also given. It will he very convenient to apply mathematic-statistical method to industrial mass production.

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Related Institution

Department of mathematics of Baoji college of Arts and scienceBaojiShaanxi 721007China

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