[1]华文玉,陈存礼.用挖补圆盘法检测金属与薄层、超薄半导体层的欧姆接触性能[J].电子学报,1997(08):33-36.

华文玉, 陈存礼. The Test of Ohmic Contact Quality for Metal／Thin Layer or Super Thin Semiconductor Layer by Adding and Taking Disc[J]. Acta Electronica Sinica, 1997, (8).

[1]华文玉,陈存礼.用挖补圆盘法检测金属与薄层、超薄半导体层的欧姆接触性能[J].电子学报,1997(08):33-36. DOI：

华文玉, 陈存礼. The Test of Ohmic Contact Quality for Metal／Thin Layer or Super Thin Semiconductor Layer by Adding and Taking Disc[J]. Acta Electronica Sinica, 1997, (8). DOI：