Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator

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Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator

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- Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator
- Acta Electronica Sinica Issue 9, (1996)
- 作者机构：
  
  1. 北京理工大学电子工程系
  2. 西安电子科技大学
  3. 北京理工大学电子工程系西安电子科技大学
- 作者简介：
- 基金信息：
- DOI：
  CLC： O441.5
- Published：1996
- 稿件说明：
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[1]夏军,梁昌洪.电磁开腔测量多层介质样品复介电常数[J].电子学报,1996(09):60-63+69.

Xia Jun. Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator[J]. Acta Electronica Sinica, 1996, (9).
[1]夏军,梁昌洪.电磁开腔测量多层介质样品复介电常数[J].电子学报,1996(09):60-63+69. DOI：

Xia Jun. Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator[J]. Acta Electronica Sinica, 1996, (9). DOI：

摘要

本文提出了一种在毫米波和亚毫米波频段利用电磁开腔测量多层介质样品复介电常数的新方法，在ｋａ波段利用特制的开腔装置建立了一套电磁开腔电介质参数测量系统，并对一些多层介质样品进行了实际测量。测量结果与标称值十分吻合。

Abstract

A new method for the measurement of complex permittivity of multilayered dielectric samples at millimeterwave and submillimeterwave bands by means of an electromagnetic open resonator is proposed. At Ka band an electromagnetic open resonator dielectric measurement system is designed and constructed using a specially machined open resonator set

and measurements on some multilayered dielectric samples are made

the results are in good agreement with the criterion values.

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