Noise as Tool to Characterize Electron Device Reliability

Zhuang Yipi and Sun Qing

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Noise as Tool to Characterize Electron Device Reliability

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- Noise as Tool to Characterize Electron Device Reliability
- Acta Electronica Sinica Issue 2, (1996)
- 作者机构：
  
  西安电子科技大学微电子所
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN606
- Published：1996
- 稿件说明：
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[1]庄奕琪,孙青.电子器件可靠性的噪声表征方法[J].电子学报,1996(02):76-82.

Zhuang Yipi and Sun Qing. Noise as Tool to Characterize Electron Device Reliability[J]. Acta Electronica Sinica, 1996, (2).
[1]庄奕琪,孙青.电子器件可靠性的噪声表征方法[J].电子学报,1996(02):76-82. DOI：

Zhuang Yipi and Sun Qing. Noise as Tool to Characterize Electron Device Reliability[J]. Acta Electronica Sinica, 1996, (2). DOI：

摘要

随着电子器件朝着高性能、小尺寸和长寿命方向发展，传统的寿命试验可靠性评价方法的局限性日益显著。近年来得到的大量研究结果表明，对于大多数电子器件，噪声是导致器件失效的各种潜在缺陷的敏感反映，噪声检测方法以其灵敏、普适、快速和非破坏性的突出优点，正在发展成为一种新型的电子器件可靠性表征工具。本文对该领域目前的研究进展做了概括性的评述。

Abstract

The conventional reliability evaluation of lifetime tests is limited with the development of electron devices toward excellent performance

small size and high reliability.It is shown from a lot of recent evidences that noise in electron devices is a sensitive measure of various reliabilitydependent defects

and hence noise measurement is expected to be a general

fast and nondestructive tool to characterize reliability in these devices.A review of recent development on the new technique is presented in this papar.

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