您当前的位置:
首页 >
文章列表页 >
Testing and Fault Detecting of Analog Integrated Circuit
更新时间:2025-12-08
    • Testing and Fault Detecting of Analog Integrated Circuit

    • Acta Electronica Sinica   Issue 10, (1995)
    • CLC: TN431.107
    • Published:1995

    移动端阅览

  • Wang Zhihua. Testing and Fault Detecting of Analog Integrated Circuit[J]. Acta Electronica Sinica, 1995, (10). DOI:

  •  
  •  
icon
试读结束,您可以激活您的VIP账号继续阅读。
去激活 >
icon
试读结束,您可以通过登录账户,到个人中心,购买VIP会员阅读全文。
已是VIP会员?
去登录 >

0

Views

428

下载量

8

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Adaptive Event-Triggered Fault Detection Filter for Jump Systems
Fast Sensor Fault Diagnosis Method Based on CA-CMAC
Fault Diagnosis Based on System-Level Diagnosis for Satellite Networks
A Fault Detection Filter Design with Eigenstructure Optimization in Wireless Networked Control Systems

Related Author

PENG Li
ZHU Feng-zeng
ZHANG Zhi-han
JIANG Bin
WEN Cheng-lin
QIU Ai-bing
YAN Ming-zhong
CHEN Chu-yao

Related Institution

Research Center of Engineering Applications for IOT, Jiangnan University
Jiangsu Province Internet of Things Application Technology Key Construction Laboratory, Wuxi Taihu College
Institute of Information and ControlHangzhou Dianzi UniversityHangzhou Zhejiang 310018China
College of Automation EngineeringNanjing University of Aeronautics and AstronauticsNanjing Jiangsu 210016China
Institute of Information and Control,Hangzhou Dianzi University
0