Survey on Full Wave Analysis of Planar Layer Dielectric Structures

陶玉明; 方大纲

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Survey on Full Wave Analysis of Planar Layer Dielectric Structures

更新时间：2025-12-08

- Survey on Full Wave Analysis of Planar Layer Dielectric Structures
- Acta Electronica Sinica Issue 10, (1995)
- 作者机构：
  
  南京理工大学
- 作者简介：
- 基金信息：
- DOI：
  CLC： O441
- Published：1995
- 稿件说明：
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[1]陶玉明,方大纲.平面分层介质结构全波分析综述[J].电子学报,1995(10):175-178.

陶玉明, 方大纲. Survey on Full Wave Analysis of Planar Layer Dielectric Structures[J]. Acta Electronica Sinica, 1995, (10).
[1]陶玉明,方大纲.平面分层介质结构全波分析综述[J].电子学报,1995(10):175-178. DOI：

陶玉明, 方大纲. Survey on Full Wave Analysis of Planar Layer Dielectric Structures[J]. Acta Electronica Sinica, 1995, (10). DOI：

摘要

本文综述了广义谱域导抗法、直线法及直线法的快速算法、全波离散镜象法等主要方法，并对各种方法的特点进行了比较，这些方法可有效地处理平面分层介质结构问题。文中包括作者近期的研究成果。

Abstract

This paper surveys generalized spectral domain immittance method

methtod of lines and its fast algorithm

full wave discrete image method and other full wave methods. The comparison of characteristics of these methods is also presented. They can be effectively used to analyse planar layer dielectric structures. The recent research works of authors are included in the paper.

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