Accurate Study of Low Level Measurement on a Spectrum Analyzer

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Accurate Study of Low Level Measurement on a Spectrum Analyzer

更新时间：2025-12-08

- Accurate Study of Low Level Measurement on a Spectrum Analyzer
- Acta Electronica Sinica Issue 3, (1995)
- 作者机构：
  
  石家庄电子工业部第五十四研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： TM935.21
- Published：1995
- 稿件说明：
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[1]秦顺友.频谱仪测量低电平的精度研究[J].电子学报,1995(03):108-111.

Qin shunyou. Accurate Study of Low Level Measurement on a Spectrum Analyzer[J]. Acta Electronica Sinica, 1995, (3).
[1]秦顺友.频谱仪测量低电平的精度研究[J].电子学报,1995(03):108-111. DOI：

Qin shunyou. Accurate Study of Low Level Measurement on a Spectrum Analyzer[J]. Acta Electronica Sinica, 1995, (3). DOI：

摘要

本文利用正弦信号加高斯噪声的包络概率密度函数，导出了频谱仪测量低电平的修正因子计算公式．给出了数值修正曲线，并用实验结果验证了理论计算的正确性．

Abstract

In this paper

calculation formulae of the correction factors of low level measurement on a specturm analyzer are derived using the envelope probability density function of a sinusoidal signal plus Gaussian noise.Correction curves of numerical value are given.The experiment results are reported to verify the correctness of theory calculation.

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