The Effect Electron Beam Geometric Deformation on the Properties of ECRM

Yu Yongjian

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The Effect Electron Beam Geometric Deformation on the Properties of ECRM

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- The Effect Electron Beam Geometric Deformation on the Properties of ECRM
- Acta Electronica Sinica Issue 12, (1994)
- 作者机构：
  
  电子科技大学电子工程系
- 作者简介：
- 基金信息：
- DOI：
  CLC： TN301
- Published：1994
- 稿件说明：
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[1]余永健.电子注成形误差对ECRM性能的影响[J].电子学报,1994(12):91-94+84.

Yu Yongjian. The Effect Electron Beam Geometric Deformation on the Properties of ECRM[J]. Acta Electronica Sinica, 1994, (12).
[1]余永健.电子注成形误差对ECRM性能的影响[J].电子学报,1994(12):91-94+84. DOI：

Yu Yongjian. The Effect Electron Beam Geometric Deformation on the Properties of ECRM[J]. Acta Electronica Sinica, 1994, (12). DOI：

摘要

在采用具有椭圆环形横截面的单能空心注模型描述电子注成形几何误差基础上，本文研究电子注成形几何误差对ＴＥ

ｍ

ｎ

０

模电子回旋谐振脉塞（ＥＣＲＭ）小信号性能的影响。通过数值计算，给出电子注小成形误差对ＴＥ

ｍ

ｎ

０

模回旋基波ＥＣＲＭ耦合系数影响的定量关系。

Abstract

In this paper is studied the effect of electron beam geometrical deforniation on the small signal properties of TE mode Electron Cyclotron Resonance Maser（ECRM）

based on the elliptically cross-sectional e-beam deformation model. As an example

the effect of some small beam deformation errors on the TE mode fundamental ECRM coupling coefficient is quantitatively shown.

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