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A Surface Correction Formula for Minority Lifetime Measurement of Silicon Crystals
更新时间：2025-12-08

    • A Surface Correction Formula for Minority Lifetime Measurement of Silicon Crystals

    • Acta Electronica Sinica   Issue 2, (1995)
    • CLC： TN304.12

    • Published：1995

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  • 阙端麟, 陈修治, 徐冬良. A Surface Correction Formula for Minority Lifetime Measurement of Silicon Crystals[J]. Acta Electronica Sinica, 1995, (2). DOI：

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