Computer-Aided Measurement of Generation Lifetime Profile

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- Computer-Aided Measurement of Generation Lifetime Profile
- Acta Electronica Sinica Issue 8, Pages: 90-92(1993)
- 作者机构：
  
  1. 杭州大学电子工程系
  2. 杭州大学电子工程系杭州310028
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1993
- 稿件说明：
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[1]张秀淼,邵迪玲.产生寿命分布的计算机辅助测量[J].电子学报,1993(08):90-92.

Zhang Xiumiao, Shao Diling. Computer-Aided Measurement of Generation Lifetime Profile[J]. Acta Electronica Sinica, 1993, (8): 90-92.
[1]张秀淼,邵迪玲.产生寿命分布的计算机辅助测量[J].电子学报,1993(08):90-92. DOI：

Zhang Xiumiao, Shao Diling. Computer-Aided Measurement of Generation Lifetime Profile[J]. Acta Electronica Sinica, 1993, (8): 90-92. DOI：

本文建议用脉冲MOS电容器的电容—时间瞬态技术测量产生寿命分布.用计算机辅助测量技术可实现阶跃电压产生

电容—时间瞬态采样读出

数据处理和产生寿命分布测量结果输出全过程的自动化.

A measurement method of generation lifetime profile is proposed

which is based on the capacttance-time（C-t）transient technique of pulsed MOS capacitors. By using the computer aided measurement

the whole measurement process

which involves sampling read out of C-t transient

data handling

and data output

is automatized.

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Related Author

Zhang Xiumiao

Ding Koubao

Related Institution

Dept. of Blectonic Engineering, Hangzhou University

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