Yield Driven CAD of MMIC

Pan Xiaomin; Xiang Jialin

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Yield Driven CAD of MMIC

更新时间：2025-12-08

- Yield Driven CAD of MMIC
- Acta Electronica Sinica Issue 12, Pages: 64-67(1992)
- 作者机构：
  
  1. 南京电子器件研究所
  2. 南京电子器件研究所南京 210016
- 作者简介：
- 基金信息：
- DOI：
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- Published：1992
- 稿件说明：
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[1]潘晓明,向家苓.以最高成品率为目标的MMIC CAD[J].电子学报,1992(12):64-67.

Pan Xiaomin, Xiang Jialin. Yield Driven CAD of MMIC[J]. Acta Electronica Sinica, 1992, (12): 64-67.
[1]潘晓明,向家苓.以最高成品率为目标的MMIC CAD[J].电子学报,1992(12):64-67. DOI：

Pan Xiaomin, Xiang Jialin. Yield Driven CAD of MMIC[J]. Acta Electronica Sinica, 1992, (12): 64-67. DOI：

摘要

本文提出了以最高成品率为目标的砷化镓微波单片集成电路（MMIC）CAD优化设计方法。讨论了提高MMIC成品率的途径

给出了详细的程序框图。用开发的软件NAMP

对一个MMIC单级放大器进行了设计

预计的成品率由原来的17.78％提高到53.55％。

Abstract

A yield driven CAD of GaAs MMIC is presented. The way of improving production yield is discussed and the detailed program flowcharts are given. With the developed NAMP software package the predictive yield of a designed single stage amplifier may be improved from 17.78% to 53.55%.

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Related Institution

Department of mathematics of Baoji college of Arts and scienceBaojiShaanxi 721007China

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