Admittance Measurement of Inclined Slot Antenna in the Narrow Wall of a Rectangular Waveguide

Shen Liying; Qing Xianming; Feng Yongcheng

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Admittance Measurement of Inclined Slot Antenna in the Narrow Wall of a Rectangular Waveguide

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- Admittance Measurement of Inclined Slot Antenna in the Narrow Wall of a Rectangular Waveguide
- Acta Electronica Sinica Issue 3, Pages: 35-39(1992)
- 作者机构：
  
  1. 电子科技大学微波测试中心
  2. 电子科技大学微波测试中心成都 610054
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1992
- 稿件说明：
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[1]沈丽英,卿显明,冯永成.波导壁上缝隙天线导纳测量[J].电子学报,1992(03):35-39.

Shen Liying, Qing Xianming, Feng Yongcheng. Admittance Measurement of Inclined Slot Antenna in the Narrow Wall of a Rectangular Waveguide[J]. Acta Electronica Sinica, 1992, (3): 35-39.
[1]沈丽英,卿显明,冯永成.波导壁上缝隙天线导纳测量[J].电子学报,1992(03):35-39. DOI：

Shen Liying, Qing Xianming, Feng Yongcheng. Admittance Measurement of Inclined Slot Antenna in the Narrow Wall of a Rectangular Waveguide[J]. Acta Electronica Sinica, 1992, (3): 35-39. DOI：

摘要

本文提出了一种测量波导窄壁上单缝天线导纳的新方法——归一化S参数法

这种方法可消除波导段引入的损耗及附加相移

不仅可精确测出单缝的电导值

而且还可测出电纳值。S波段缝隙天线导纳的测量结果与理论值吻合

证明了该方法的正确性。最后分析了主要误差源及减小测试误差的措施。

Abstract

A new normalized S parameter method of measuring admittance of inclined slot antenna in the narrow wall of a rectangular waveguide is presented in this paper. Because attenuation and phase shift of measured waveguide section are deleted

we can obtain the conductance and susceptance of a slot accurately. The rightness of this method is examined by a close agreement between the theoretical and experimental results in S band. The error sources and the method of decreasing measurement error are described at last.

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