A Rapid and Broad-Band Technique for Measurement of Complex Permittivity ol MIC Substrates

Tang Zhongxi; Zhang Qishao

您当前的位置：

首页 >

文章列表页 >

A Rapid and Broad-Band Technique for Measurement of Complex Permittivity ol MIC Substrates

更新时间：2025-12-08

- A Rapid and Broad-Band Technique for Measurement of Complex Permittivity ol MIC Substrates
- Acta Electronica Sinica Issue 5, Pages: 81-86(1991)
- 作者机构：
  
  1. 电子科技大学
  2. 电子科技大学成都
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1991
- 稿件说明：
移动端阅览
[1]唐宗熙,张其劭.微波集成电路基片复介电常数快速宽频带测试技术[J].电子学报,1991(05):81-86.

Tang Zhongxi, Zhang Qishao. A Rapid and Broad-Band Technique for Measurement of Complex Permittivity ol MIC Substrates[J]. Acta Electronica Sinica, 1991, (5): 81-86.
[1]唐宗熙,张其劭.微波集成电路基片复介电常数快速宽频带测试技术[J].电子学报,1991(05):81-86. DOI：

Tang Zhongxi, Zhang Qishao. A Rapid and Broad-Band Technique for Measurement of Complex Permittivity ol MIC Substrates[J]. Acta Electronica Sinica, 1991, (5): 81-86. DOI：

摘要

本文提出了一种微波集成电路基片复介电常敛测试技术

其测试频率范围为1～20CHz

εJ的测试范围为2～25

tanδ的测试范围为3×10

-4

～1×10

-2

可以测试各种柔性和刚性的介质基片材料

则试ε′

的不确定度优于±1％

tanδ的不确定度约为±10％。该测试技术实现了无损和自动化测量

测试电路简单

测试速度快

尤其适用于介质基片的批量和在线检测。

Abstract

A technique is presented for the measurement of complex permittivity of MIC substrates. The test frequencies range from 1 to 20 GHz. This technique covers determination of εr’ and tan5 of MIC substrates with εr’ in the range from 2 to 25 and with tan5 in the range from 3×10-4 to 1 × 10-2. All kinds of flexible and rigid materials of MIC substrates can be measured. An uncertainty of εr’ is less than ±1%

and that of tanδ is about ±10%. Nondestructive and automated measurements are made. The test circuit is simple

and the test speed is rapid. The technique is particularly suitable for industrial surveying of complex permittivity of MIC substrates.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

No data

Related Author

No data

Related Institution

No data

⁰