Bipoar Analog Integrated Circuit Computer Aided Dissection and Verification System

Ye Ming; Zhang Ming; Cao Yang

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Bipoar Analog Integrated Circuit Computer Aided Dissection and Verification System

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- Bipoar Analog Integrated Circuit Computer Aided Dissection and Verification System
- Acta Electronica Sinica Issue 5, Pages: 92-93(1992)
- 作者机构：
  
  1. 浙江大学
  2. 浙江大学杭州 310008
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1992
- 稿件说明：
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[1]叶铭,张明,曹阳.双极模拟集成电路计算机辅助剖析和验证系统[J].电子学报,1992(05):92-93.

Ye Ming, Zhang Ming, Cao Yang. Bipoar Analog Integrated Circuit Computer Aided Dissection and Verification System[J]. Acta Electronica Sinica, 1992, (5): 92-93.
[1]叶铭,张明,曹阳.双极模拟集成电路计算机辅助剖析和验证系统[J].电子学报,1992(05):92-93. DOI：

Ye Ming, Zhang Ming, Cao Yang. Bipoar Analog Integrated Circuit Computer Aided Dissection and Verification System[J]. Acta Electronica Sinica, 1992, (5): 92-93. DOI：

摘要

本文介绍双极模拟集成电路计算机辅助剖析和验证系统的功能、特点及主要编制原理。

Abstract

A Bipolar Analog Integrated Circuit Computer Aided Dissection and Verification System （BAIC CAD & CAV System） had been developed successfully. Its main funitions、characteristics and basic principles are discribed in the paper.

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