UV Photo-electronic Method for Measurement of MCP Characteristic Parameters

Tian Jingquan; Jiang Delong; Wu Kui

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UV Photo-electronic Method for Measurement of MCP Characteristic Parameters

更新时间：2025-12-08

- UV Photo-electronic Method for Measurement of MCP Characteristic Parameters
- Acta Electronica Sinica Issue 5, Pages: 121-123(1990)
- 作者机构：
  
  长春光机学院
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1990
- 稿件说明：
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[1]田景全,姜德龙,吴奎.测量MCP特性参数的紫外光电法[J].电子学报,1990(05):121-123.

Tian Jingquan, Jiang Delong, Wu Kui. UV Photo-electronic Method for Measurement of MCP Characteristic Parameters[J]. Acta Electronica Sinica, 1990, (5): 121-123.
[1]田景全,姜德龙,吴奎.测量MCP特性参数的紫外光电法[J].电子学报,1990(05):121-123. DOI：

Tian Jingquan, Jiang Delong, Wu Kui. UV Photo-electronic Method for Measurement of MCP Characteristic Parameters[J]. Acta Electronica Sinica, 1990, (5): 121-123. DOI：

摘要

本文介绍了紫外光电法的测试装置、工作原理和测量结果

并对应用前景作了讨论。

Abstract

In this paper

the equipments principles and results n measuring characteristic parameter of MCP by UV photo-electronic method are presented. Prospects in application of this method are also discussed.

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UV Photo-electronic Method for Measurement of MCP Characteristic Parameters

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