An Inspection Method for Analysis of General Switched-Capacitor Networks

Li Bi-xia; Gu De-ren

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An Inspection Method for Analysis of General Switched-Capacitor Networks

更新时间：2025-12-08

- An Inspection Method for Analysis of General Switched-Capacitor Networks
- Acta Electronica Sinica Issue 5, Pages: 52-57(1989)
- 作者机构：
  
  1. 电子科技大学
  2. 电子科技大学成都
- 作者简介：
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- DOI：
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- Published：1989
- 稿件说明：
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[1]李碧霞,顾德仁.一种分析开关电容网络的观察法[J].电子学报,1989(05):52-57.

Li Bi-xia, Gu De-ren. An Inspection Method for Analysis of General Switched-Capacitor Networks[J]. Acta Electronica Sinica, 1989, (5): 52-57.
[1]李碧霞,顾德仁.一种分析开关电容网络的观察法[J].电子学报,1989(05):52-57. DOI：

Li Bi-xia, Gu De-ren. An Inspection Method for Analysis of General Switched-Capacitor Networks[J]. Acta Electronica Sinica, 1989, (5): 52-57. DOI：

摘要

本文给出了一种分析开关电容网络的简单方法。这种方法主要以节点导纳矩阵为基础。它可以快速观察分析中等规模的多相开关电容网络。

Abstract

A simple inspection method for the analysis of general SC networks is presented. The method makes it possible to inspect and analyze multiphase SC networks with medium complexity with a rapid speed.

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An Inspection Method for Analysis of General Switched-Capacitor Networks

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