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中国科学院半导体所
Published:1987
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[1]魏策军.HEMT直流特性、微波和噪声参量的计算[J].电子学报,1987(04):15-23.
Wei Ce-Jun. Calculations of DC Characteristics,Microwave and Noise Parameters of HEMT[J]. Acta Electronica Sinica, 1987, (4): 15-23.
本文全面分析计算了HEMT器件的直流特性、微波和噪声参量。考虑了二维电子气密度与费米能级关系
得出修正后的电荷控制模型
并结合饱和速度特性计算了HEMT直流特性
同时讨论了负迁移率特性影响。本文第一次得出了HEMT电容特性与噪声参量分析表示式
计算Fukui噪声参数K
F
表明其值比GaAs MESFET小50~70%。
A comprehensive analysis concerning the calculations of DC Characteristics
microwave and noise parameters of HEMT is given.A modified charge-control model taking account of the effects of ns
ε
F dependence is utilized.The DC characteristics are calculated by using saturation model with a minor modification when negative mobility model involved.Analytical formulas for M-W behaviors and intrinsic noise parameters are derived
and the Fukui coefficient obtained KF is 50
7
0% smaller than that of GaAs MESFET.
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