Test of Low Frequency Voltage Noise Density for High Precision Linear IC

Xu Jian-shi

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Test of Low Frequency Voltage Noise Density for High Precision Linear IC

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- Test of Low Frequency Voltage Noise Density for High Precision Linear IC
- Acta Electronica Sinica Issue 3, Pages: 112-113(1987)
- 作者机构：
  
  1. 济南市电子技术研究所
  2. 山东大学
  3. 济南市电子技术研究所山东大学
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1987
- 稿件说明：
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[1]徐剑石,卢兆明.高精度线性电路低频电压噪声密度的测试[J].电子学报,1987(03):112-113.

Xu Jian-shi. Test of Low Frequency Voltage Noise Density for High Precision Linear IC[J]. Acta Electronica Sinica, 1987, (3): 112-113.
[1]徐剑石,卢兆明.高精度线性电路低频电压噪声密度的测试[J].电子学报,1987(03):112-113. DOI：

Xu Jian-shi. Test of Low Frequency Voltage Noise Density for High Precision Linear IC[J]. Acta Electronica Sinica, 1987, (3): 112-113. DOI：

摘要

文中报告了作者研制的QD-3181型线性电路电压噪声测试仪

给出了对几种高精度线性集成电路低频电压噪声密度的测量结果和比较。在10Hz、100Hz、1kHz三点频下

测得作者研制的超β器件的低频电压噪声密度分别为4.0nV/（Hz）

1/2

、2.0nV/（Hz）（1/2）和1.5nV/（Hz）

1/2

。

Abstract

QD-3182 linear circurt voltage noise test instrument has been developed. Several measured results for low frequency voltage noise density in high precision linear integrated circuit are given and compared with each other. The voltage noise densities in our super-β device measured at 10Hz

100 Hz and 1kHz are 4.0nV/Hz

2.0nV/Hz and 1.5nV/Hz respectively.

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