Robust Test Generation Algorithm-for Stuck-Open Faults in CMOS Combinational Circuits

Mao Wei-Wei; Ling Xie-ting

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Robust Test Generation Algorithm-for Stuck-Open Faults in CMOS Combinational Circuits

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- Robust Test Generation Algorithm-for Stuck-Open Faults in CMOS Combinational Circuits
- Acta Electronica Sinica Issue 4, Pages: 44-50(1987)
- 作者机构：
  
  复旦大学电子工程系
- 作者简介：
- 基金信息：
- DOI：
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- Published：1987
- 稿件说明：
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[1]茅巍巍,凌燮亭.CMOS电路开路故障的Robust测试生成算法[J].电子学报,1987(04):44-50.

Mao Wei-Wei, Ling Xie-ting. Robust Test Generation Algorithm-for Stuck-Open Faults in CMOS Combinational Circuits[J]. Acta Electronica Sinica, 1987, (4): 44-50.
[1]茅巍巍,凌燮亭.CMOS电路开路故障的Robust测试生成算法[J].电子学报,1987(04):44-50. DOI：

Mao Wei-Wei, Ling Xie-ting. Robust Test Generation Algorithm-for Stuck-Open Faults in CMOS Combinational Circuits[J]. Acta Electronica Sinica, 1987, (4): 44-50. DOI：

摘要

本文提出了一种CMOS电路开路故障的测试生成算法

检测开路故障所需的复位输入T

和测试输入T

可以一次同时产生

并且能够保证所得的测试是Robust测试。

Abstract

A test generation algorithm for stuck-open faults in CMOS combinational circuits is presented.An initializing input pattern T1 and a test input pattern T2 can be generated at the same time.It is shown that the test （T1

T2） generated using the algorithm is a robust test.

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