The Self-Adaptive Mesh Refinement Technique for the Finite Element Analysis of Semiconductor Devices

Tan Gen-lin; Wu Yun-jian; Yang Lin

您当前的位置：

首页 >

文章列表页 >

The Self-Adaptive Mesh Refinement Technique for the Finite Element Analysis of Semiconductor Devices

更新时间：2025-12-08

- The Self-Adaptive Mesh Refinement Technique for the Finite Element Analysis of Semiconductor Devices
- Acta Electronica Sinica Issue 3, Pages: 94-98(1987)
- 作者机构：
  
  北京工业大学
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1987
- 稿件说明：
移动端阅览
[1]谈根林,武云建,杨琳.半导体器件有限元分析的网格自适应剖分技术[J].电子学报,1987(03):94-98.

Tan Gen-lin, Wu Yun-jian, Yang Lin. The Self-Adaptive Mesh Refinement Technique for the Finite Element Analysis of Semiconductor Devices[J]. Acta Electronica Sinica, 1987, (3): 94-98.
[1]谈根林,武云建,杨琳.半导体器件有限元分析的网格自适应剖分技术[J].电子学报,1987(03):94-98. DOI：

Tan Gen-lin, Wu Yun-jian, Yang Lin. The Self-Adaptive Mesh Refinement Technique for the Finite Element Analysis of Semiconductor Devices[J]. Acta Electronica Sinica, 1987, (3): 94-98. DOI：

摘要

本文给出了一种用于半导体器件有限元分析的网格自适应细分技术。计算表明

这种方法可以显著地减少网点和非线性迭代次数

从而显著地减小了计算成本

提高了分析的效率。

Abstract

A self-adaptive mesh refinement technique for the finite element analysis of semiconductor devices is given. The computation shows that such technique can considerably reduce the number of mesh points and non-linear iterations. Thus the computation cost is decreased and efficiency of devices analysis is improved remarkably.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

No data

Related Author

No data

Related Institution

No data

⁰