Analysis of the Effect of Frequency Back-push, False lock and Rejection to Acquisition at PLL

Guan Zhen-rou

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Analysis of the Effect of Frequency Back-push, False lock and Rejection to Acquisition at PLL

更新时间：2025-12-08

- Analysis of the Effect of Frequency Back-push, False lock and Rejection to Acquisition at PLL
- Acta Electronica Sinica Issue 5, Pages: 20-25(1985)
- 作者机构：
  
  西南电子技术研究所
- 作者简介：
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- DOI：
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- Published：1985
- 稿件说明：
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[1]关振柔.锁相环的频率反推、假锁与拒捕效应的分析[J].电子学报,1985(05):20-25.

Guan Zhen-rou. Analysis of the Effect of Frequency Back-push, False lock and Rejection to Acquisition at PLL[J]. Acta Electronica Sinica, 1985, (5): 20-25.
[1]关振柔.锁相环的频率反推、假锁与拒捕效应的分析[J].电子学报,1985(05):20-25. DOI：

Guan Zhen-rou. Analysis of the Effect of Frequency Back-push, False lock and Rejection to Acquisition at PLL[J]. Acta Electronica Sinica, 1985, (5): 20-25. DOI：

摘要

本文讨论锁相环具有高频环节时

该环节的时延引起捕获过程的频率反推、拒捕现象与假锁的固有关系。分析建立在Develet及Gardner所作工作的基础上

但修正了Gardner关于形成假锁的条件

同时指出Gardner关于假锁只能发生在牵引曲线的假零点处这种观点的局限性。文中还给出了环路不发生拒捕时各种参数间的关系。

Abstract

The inherent relation among the false lock and the phenomena of frequency back-push and rejection to acquisition is discussed which caused by the time-delay when the PLL has a H. F. link. The analysis is based on the work of Develet and Gardner

but it revises the condition for establishing the false lock and points out the limitation of the viewpoint that the false lock only occurs in the pseudo-zero at pulling curve. Also presented is the relation of different parameters that should be maintained when no rejection happens to signal acquisition.

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