Analysis for Failure Mechanism of Oxide Cathodes in TV-tubes

Bai He-xiang; Zhao Shou-zhen

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Analysis for Failure Mechanism of Oxide Cathodes in TV-tubes

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- Analysis for Failure Mechanism of Oxide Cathodes in TV-tubes
- Acta Electronica Sinica Issue 1, Pages: 61-64(1985)
- 作者机构：
  
  南开大学
- 作者简介：
- 基金信息：
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- Published：1985
- 稿件说明：
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[1]白鹤翔,赵守珍.显象管中阴极失效机理的分析[J].电子学报,1985(01):61-64.

Bai He-xiang, Zhao Shou-zhen. Analysis for Failure Mechanism of Oxide Cathodes in TV-tubes[J]. Acta Electronica Sinica, 1985, (1): 61-64.
[1]白鹤翔,赵守珍.显象管中阴极失效机理的分析[J].电子学报,1985(01):61-64. DOI：

Bai He-xiang, Zhao Shou-zhen. Analysis for Failure Mechanism of Oxide Cathodes in TV-tubes[J]. Acta Electronica Sinica, 1985, (1): 61-64. DOI：

摘要

本文用离子探针（IMA）和扫描电子显微镜（SEM）对不同寿命显象管中阴极的失效机理进行了初步分析。结果表明:不同寿命下超额Ba在涂层内的分布是中间含量大于两端

其含量峰值随寿命下降并内移

相对含量亦随寿命而降低;寿命初期Ni与涂层介面处有Mg的富集峰。随着寿命加长

Mg的总量降低

富集蜂内移;在Ni中有Ba的“反扩散”现象

Ba的累积量和渗透深度均随寿命而增加。上述现象对电子发射均产生不良影响。

Abstract

:The failure mechanism of oxide-coated cathodes in TV-tubes with different life-span is analysed by IMA and SEM. Results obtained show that the distribution of excess Ba changes from being uniform to non-uniform with time

and excess Ba also appears in the surface layer of the oxide coating. It is found that the back-diffusion phenomenon of excess Ba occurs in active Ni. The total number of excess Ba or Mg in the cathode decreses evidently with lifespan. All these are reasons for the decay in emission of the cathode.

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