New Method of Measuring Two-Port Devices by Six-Port Reflectometer

Sun Jia

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New Method of Measuring Two-Port Devices by Six-Port Reflectometer

更新时间：2025-12-08

- New Method of Measuring Two-Port Devices by Six-Port Reflectometer
- Acta Electronica Sinica Issue 1, Pages: 44-50(1986)
- 作者机构：
  
  成都电讯工程学院
- 作者简介：
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- DOI：
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- Published：1986
- 稿件说明：
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[1]孙稼.六端口反射仪测量双口器件的新方法[J].电子学报,1986(01):44-50.

Sun Jia. New Method of Measuring Two-Port Devices by Six-Port Reflectometer[J]. Acta Electronica Sinica, 1986, (1): 44-50.
[1]孙稼.六端口反射仪测量双口器件的新方法[J].电子学报,1986(01):44-50. DOI：

Sun Jia. New Method of Measuring Two-Port Devices by Six-Port Reflectometer[J]. Acta Electronica Sinica, 1986, (1): 44-50. DOI：

摘要

本文提出了用单六端口反射仪测量双口微波网络散射参量的一种改进电路

并用波叠加原理和等效电路原理提出了校准和测量方法。

Abstract

A new circuit is given for measuring scattering parameters of any two-port microwave network by means of a single six-port reflectometer. Based on the wave superposition theory and the theory of equivalent circuit

a new method of calibration and measurement is described.

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