Stability Criteria for General and Delay Sampled Phase-Locked Loops

Sun Qi-wan

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Stability Criteria for General and Delay Sampled Phase-Locked Loops

更新时间：2025-12-08

- Stability Criteria for General and Delay Sampled Phase-Locked Loops
- Acta Electronica Sinica Issue 3, Pages: 29-35(1985)
- 作者机构：
  
  西南电子技术研究所
- 作者简介：
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- Published：1985
- 稿件说明：
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[1]孙启万.一般和延时取样锁相环的稳定性研究[J].电子学报,1985(03):29-35.

Sun Qi-wan. Stability Criteria for General and Delay Sampled Phase-Locked Loops[J]. Acta Electronica Sinica, 1985, (3): 29-35.
[1]孙启万.一般和延时取样锁相环的稳定性研究[J].电子学报,1985(03):29-35. DOI：

Sun Qi-wan. Stability Criteria for General and Delay Sampled Phase-Locked Loops[J]. Acta Electronica Sinica, 1985, (3): 29-35. DOI：

摘要

本文根据取样数据控制系统的稳定性理论

利用z变换和修正变换方法

导出了取样锁相环和延时取样锁相环在工程设计中常用的一般稳定判据。文中还给出了这些稳定判据间的重要关系。

Abstract

General stability criteria commonly used in the design of sampled phase-locked loops and delay sampled phase-locked loops are derived by using the stability theory for sam-pled-data control systems as well as the z-transform method and its modification. The important relationships of these criteria are also given.

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