A Bilinear Algorithm for the Identification of Single and Multiple Faults in Analog Circuits

Li Yu-fan

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A Bilinear Algorithm for the Identification of Single and Multiple Faults in Analog Circuits

更新时间：2025-12-08

- A Bilinear Algorithm for the Identification of Single and Multiple Faults in Analog Circuits
- Acta Electronica Sinica Issue 1, Pages: 31-37(1985)
- 作者机构：
  
  华南工学院无线电工程系
- 作者简介：
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- Published：1985
- 稿件说明：
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[1]李于凡.模拟电路单一差错与多重差错的双线性求值判断法[J].电子学报,1985(01):31-37.

Li Yu-fan. A Bilinear Algorithm for the Identification of Single and Multiple Faults in Analog Circuits[J]. Acta Electronica Sinica, 1985, (1): 31-37.
[1]李于凡.模拟电路单一差错与多重差错的双线性求值判断法[J].电子学报,1985(01):31-37. DOI：

Li Yu-fan. A Bilinear Algorithm for the Identification of Single and Multiple Faults in Analog Circuits[J]. Acta Electronica Sinica, 1985, (1): 31-37. DOI：

摘要

本文阐明了模拟电路双线性偏差映射理论

提出了单一差错与多重差错的求值判断法。不论差错元件是短路、开路或任意参数偏离

可用线性方法从外部若干个测量值确定其差错位置并计算出其差错值。文末用了一个实例在侦错效果上与别的方法作了比较。

Abstract

A bilinear deviation theory for analog circuits is discussed

and an algorithm for the identification of single and multiple faults is proposed

with this algorithm

both hard and soft faults can be located and evaluated from insufficient measurements by solving linear algebraic equations

and the fault testability is independent of the selection of test points. A comparison is made between this algorithm and the other two algorithms with a numerical example.

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