On the Reliability Evaluation and Failure Mechanism of RC Electronic Components

Zhang Shi-ying; Zhang Wei-zu

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On the Reliability Evaluation and Failure Mechanism of RC Electronic Components

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- On the Reliability Evaluation and Failure Mechanism of RC Electronic Components
- Acta Electronica Sinica Issue 1, Pages: 94-103(1984)
- 作者机构：
  
  1. 宏明无线电器材厂
  2. 宏明无线电器材厂成都
- 作者简介：
- 基金信息：
- DOI：
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- Published：1984
- 稿件说明：
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[1]章士瀛,张伟祖.阻容元件的可靠性评价和失效机理[J].电子学报,1984(01):94-103.

Zhang Shi-ying, Zhang Wei-zu. On the Reliability Evaluation and Failure Mechanism of RC Electronic Components[J]. Acta Electronica Sinica, 1984, (1): 94-103.
[1]章士瀛,张伟祖.阻容元件的可靠性评价和失效机理[J].电子学报,1984(01):94-103. DOI：

Zhang Shi-ying, Zhang Wei-zu. On the Reliability Evaluation and Failure Mechanism of RC Electronic Components[J]. Acta Electronica Sinica, 1984, (1): 94-103. DOI：

摘要

本文以大量的可靠性试验统计数据为基础

分析了和论述了我国阻容电子元件的筛选技术、可靠性评价及失效机理。讨论了当前高可靠工作中的几个重要问题

并提出了一些建议。

Abstract

On the large number of reliability test statistic data

the selection technology

reliability evaluation and failure mechanism of RC electronic components are analysed and discussed. For several important questions in the recent reliability work

this paper puts forward some suggestions.

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