Since the integration level of the logical circuits developed to LSI and VLSI

the testing problem of the integrated circuits has become very complicated and critical. In order to reduce the cost for the test generation

the testability design for the circuit must be done in advance. But most of the existing design techniques for testability are suitable for certain special circuits

thus can not be used in the general case. Although the Guide Line technique can be applied to any circuit

so far the guide points are set manually and empirically

and usually the optimal improvement can not be achieved. This paper proposes an automatic Guide Line design technique based on integer linear programming

from which we can obtain the optimal testability design for the circuit. By running the program we got some experimental results which not only verify the correctness of the technique but also show that the suggestions of some authors are subject to further study.