H-Algorithm for Test Generation of Asynchronous Circuits

Ruan Gen-hong

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H-Algorithm for Test Generation of Asynchronous Circuits

更新时间：2025-12-08

- H-Algorithm for Test Generation of Asynchronous Circuits
- Acta Electronica Sinica Issue 1, Pages: 49-57(1983)
- 作者机构：
  
  复旦大学
- 作者简介：
- 基金信息：
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- Published：1983
- 稿件说明：
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[1]阮根鸿.异步时序电路的测试生成法——H算法[J].电子学报,1983(01):49-57.

Ruan Gen-hong. H-Algorithm for Test Generation of Asynchronous Circuits[J]. Acta Electronica Sinica, 1983, (1): 49-57.
[1]阮根鸿.异步时序电路的测试生成法——H算法[J].电子学报,1983(01):49-57. DOI：

Ruan Gen-hong. H-Algorithm for Test Generation of Asynchronous Circuits[J]. Acta Electronica Sinica, 1983, (1): 49-57. DOI：

摘要

本文以六值逻辑系统为基础

提出了可求得异步时序电路中固定故障的测试的新算法—H算法。将H算法与Muth的九值算法进行了比较

指出了九值算法的局限性。H算法克服了九值算法的缺点

是一个能够在电路中存在回路的情况下找寻敏化通路的算法

并且可以使得所求得的测试无竞态。

Abstract

On the basis of the six-valued logic system

an H-algorithm is suggested for the test generation of asynchronous sequential circuits. A comparison between the H-algorithm and the nine-valued algorithm is made. It is shown that the H-algorithm guarantees the validity of the obtained test sequence and keeps the sequence free from race condition.

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