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中国科学院武汉物理研究所
Published:1981
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[1]曾锡之,沈安石.倍频器相位变化的测量[J].电子学报,1981(01):83-88.
Zeng Xi-zhi, Shen An-shi. Measurements of Phase Variations in Frequency Multipliers[J]. Acta Electronica Sinica, 1981, (1): 83-88.
本文给出了原子频标中的一种倍频线路。作者设计了相位测量系统和单边带多周期测量系统。用这些系统测定了倍频器的相位漂移和相位噪声。测量表明
温度从30℃升至50℃时
×18倍频器的90MHz输出的相位变化为14°;电源电压从20V升至22V时
相位变化为4.7°;取样时间τ=1s时
倍频器6840MHz输出由相位噪声引起的频率误差σ
τ
=1.1×10
-12
τ=10s时
σ
τ
=3.9×10
-13
。
Certain pratical guidelines and design methods for getting optimal characteristics in frequency multipliers are considered
and one of the frequency multiplying circuits in atomic frequency standards is given. The phase drift at the 90MHz output of the ( × 18) frequency multiplier is measured with a phase drift measurment set-up made during the study. The results show that phase drift Δφ = 14° when the ambient temperature varies from 30℃ to 50℃; Δφ=4.7 when the supply-voltage varies from 20V to 22V. The phase noise in our multiplier is also measured with another multiple-period measurement set-up with single sideband mixing designed by authors. Results show that the fractional frequency error due to phase noise in the multiplier is 1.1×10-12 when the averaging time τ = 1 sec.
the fractional error is 3.9×10-13 when the averaging time τ= 10 sec.
A simple method of single sideband mixing in the frequency multiplier is observed and explained.
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