Fault Diagnosis Method Based on Test Set Reordering Combined with Structural Features

OUYANG Dan-tong; LIU Yang; SONG Jin-cai; WANG Hao-ran; ZHANG Li-ming

doi:10.12263/DZXB.20200399

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Fault Diagnosis Method Based on Test Set Reordering Combined with Structural Features

PAPERS | 更新时间：2025-12-08

- Fault Diagnosis Method Based on Test Set Reordering Combined with Structural Features
- ACTA ELECTRONICA SINICA Vol. 50, Issue 1, Pages: 63-71(2022)
- 作者机构：
  
  1.吉林大学计算机科学与技术学院，吉林长春 130012
  2.吉林大学软件学院，吉林长春 130012
  3.符号计算与知识工程教育部重点实验室（吉林大学），吉林长春 130012
  4.中国科学院大学计算机科学与技术学院，北京 100000
- 作者简介：
- 基金信息：
- DOI：10.12263/DZXB.20200399
  CLC： TP391;
- Received：27 April 2020，
  
  Revised：2021-01-04，
  
  Published：25 January 2022
- 稿件说明：
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欧阳丹彤,刘扬,宋金彩等.结合结构特征基于测试集重排序的故障诊断方法[J].电子学报,2022,50(01):63-71.

OUYANG Dan-tong,LIU Yang,SONG Jin-cai,et al.Fault Diagnosis Method Based on Test Set Reordering Combined with Structural Features[J].ACTA ELECTRONICA SINICA,2022,50(01):63-71.
欧阳丹彤,刘扬,宋金彩等.结合结构特征基于测试集重排序的故障诊断方法[J].电子学报,2022,50(01):63-71. DOI： 10.12263/DZXB.20200399.

OUYANG Dan-tong,LIU Yang,SONG Jin-cai,et al.Fault Diagnosis Method Based on Test Set Reordering Combined with Structural Features[J].ACTA ELECTRONICA SINICA,2022,50(01):63-71. DOI： 10.12263/DZXB.20200399.

摘要

故障诊断是集成电路领域中的重要研究方向，基于测试激励集方法求解候选故障诊断是目前较为高效的诊断方法，而GTreord是目前具有较高诊断准确性的方法.在对GTreord方法深入研究的基础上，本文依据测试激励与候选故障诊断解之间的结构特征，通过分析电路故障输出响应，提出结合结构特征的测试激励集重排序的候选诊断（Reordering Test Default Diagnosis，RTDD）方法.根据测试激励对生成候选故障诊断解集合的影响程度的不同，提出测试分数概念；通过比较电路的实际故障输出响应、无故障输出响应、模型故障输出响应，计算出测试激励的测试分数.测试激励集依据测试分数进行重排序，并将重排序后的测试激励集用于故障诊断.实验结果表明，与GTreord方法相比，RTDD方法提高了测试激励集重排序的效率，求解时间提高1~4个数量级；此外，在保障同样诊断准确性的情况下，RTDD方法有效减少了所需测试的激励个数.

Abstract

Fault diagnosis is a main direction in the research of integrated circuits which can solve candidate fault diagnosis based on test sets effectively. GTreord is a method with the best diagnostic accuracy currently. Based on deep analysis of the GTreord method

in this paper

a candidate diagnosis solution method based on test set reordering is proposed

referred as RTDD. RTDD method is based on the structural characteristics between the test and the candidate fault diagnosis solutions and analyzes the circuit fault output response. According to the different influence degrees of test on the generation of candidate fault diagnosis solution set

the notion of test score is presented. By comparing the actual fault output response

non-fault output response and model fault output response of the circuit

the test score of the test is obtained. The test set is reordered according to the test score

and the reordered test is applied to the fault diagnosis. Compared with the GTreord method

the experiments show that RTDD method improves the efficiency of test set reordering

and the running time is improved by 1-4 orders of magnitude. In addition

RTDD method effectively reduces the number of required test under the same diagnostic accuracy.

关键词

Keywords

references

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