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Enhanced Artificial Bee Colony Algorithm to Solve Semiconductor Final Test Scheduling Problem
PAPERS | 更新时间:2025-12-08
    • Enhanced Artificial Bee Colony Algorithm to Solve Semiconductor Final Test Scheduling Problem

    • ACTA ELECTRONICA SINICA   Vol. 49, Issue 9, Pages: 1708-1715(2021)
    • DOI:10.12263/DZXB.20210039    

      CLC: TP391.9;TN406
    • Received:29 December 2020

      Revised:2021-02-10

      Published:25 September 2021

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  • LÜ Yang,QIAN Bin,HU Rong,et al.Enhanced Artificial Bee Colony Algorithm to Solve Semiconductor Final Test Scheduling Problem[J].ACTA ELECTRONICA SINICA,2021,49(09):1708-1715. DOI: 10.12263/DZXB.20210039.

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